X-Ray Diffraction

Phase identification for crystalline materials and unit cell dimensions

XRD is a non-destructive technique for characterizing crystalline materials. XRD can be used to identify and quantify most crystalline phases. The sample is irradiated with monochromatic x-rays causing characteristic diffractions patterns from the irradiated crystal phases. XRD can detects all elements, with detection limits of ~1% and depth resolution between ~20 Angstroms to ~30 microns depending on material properties and x-ray incidence angles.

• Phase composition determination
• Percent crystallinity determination in polymers
• Quantification of specific crystalline phases, such as an inorganic polymer fillers
• Identify contamination or corrosion product