Phase identification for crystalline materials and unit cell dimensions
XRD is a non-destructive technique for characterizing crystalline materials. XRD can be used to identify and quantify most crystalline phases. The sample is irradiated with monochromatic x-rays causing characteristic diffractions patterns from the irradiated crystal phases. XRD can detects all elements, with detection limits of ~1% and depth resolution between ~20 Angstroms to ~30 microns depending on material properties and x-ray incidence angles.
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