Phase identification for crystalline materials and unit cell dimensions

XRD is a non-destructive technique for characterizing crystalline materials. XRD can be used to identify and quantify most crystalline phases. The sample is irradiated with monochromatic x-rays causing characteristic diffractions patterns from the irradiated crystal phases. XRD can detects all elements, with detection limits of ~1% and depth resolution between ~20 Angstroms to ~30 microns depending on material properties and x-ray incidence angles.

  • Phase composition determination
  • Percent crystallinity determination in polymers
  • Quantification of specific crystalline phases, such as an inorganic polymer fillers
  • Identify contamination or corrosion product

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