Bringing Material and Life Science to the Atomic Scale

Transmission Electron Microscopy (TEM) is a type of electron microscopy that uses a beam of high energy electrons transmitted through a very thin sample.

TEM is a powerful tool for exploring the micro- and nano-scale world. It can provide information on materials from the micron scale down to the atomic scale.  The possibility for high magnifications has made TEM a valuable tool in physical, biological, and materials research. It can provide information not only about size, morphology and crystallographic information, but also about elemental and chemical composition of particles, by applying various added techniques and accessories, such as energy-dispersive X-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS). TEM is especially useful for characterization of the morphology of nanoparticles as light microscopy does not have sufficient magnification to image at the nanometer size scale.

TEM is an impressive instrument with a number of advantages such as:

  • Offers the most powerful magnification and resolution among microscopy techniques
  • Provides information on surface features, shape, size, element, and compound structure
  • Wide applications in biological, physical, and material science
  • Morphology of Nanoparticles
  • High quality, detailed images

Related standards

  • 14708
  • 232/2232
  • 787
  • 789
  • ASTM D4176
  • EN 45502
  • International Organization for Standardization
  • USP

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