Using diffraction grating, ICP-OES separates the light emitted from the plasma into its discrete component wavelength.  This system is an optical system with a range of 165-800 nm which can be viewed and measured.  Each element is detected by their own distinct set of emission wavelengths.

Boasting a similar elemental range to ICP-MS, ICP-OES is ideally suited for single element analysis, and provides greater accuracy at high concentrations than ICP-MS for single elemental detection, while still detecting ppm levels of single elements.

  • High accuracy elemental concentration
  • Cost-effective
  • Excellent Quality control method

We are passionate about your success. Tell us more about your regulatory and quality needs to learn about how we can help.

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